Title:
INSPECTION MANAGEMENT DEVICE, INSPECTION MANAGEMENT METHOD, AND INSPECTION MANAGEMENT PROGRAM
Document Type and Number:
Japanese Patent JP2022102910
Kind Code:
A
Abstract:
To improve work efficiency in allocating the most suitable lot(s) of stock to each destination which is a combination of a client and a delivery destination when using different inspection standards for different destinations.SOLUTION: An inspection management device according to an embodiment includes: first master data which consists of inspection patterns each of which has been registered for a destination which is a combination of a client and a delivery destination and a product; second master data which consists of inspection standard values for multiple inspection items which have been registered for the respective inspection patterns; received-order input means with which received-order information including a destination, a product, and a scheduled shipping quantity is inputted; and stock allocation means which, when allocating stock for the received order, obtains an inspection pattern from the first master data using the destination and the product in the received-order information as keys, obtains inspection standard values for multiple inspection items from the second master data using the obtained inspection pattern as a key, and allocates a lot(s) whose inspection result(s) meets/meet the inspection standard values of the inspection items which have been obtained, out of candidate products in stock/inspection information.SELECTED DRAWING: Figure 1
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Inventors:
FUJISAWA TSUBASA
UENO TAKEMITSU
UENO TAKEMITSU
Application Number:
JP2020217976A
Publication Date:
July 07, 2022
Filing Date:
December 25, 2020
Export Citation:
Assignee:
OBIC CO LTD
International Classes:
G06Q50/04
Attorney, Agent or Firm:
Sakai International Patent Office