To obtain inspection technology for an active matrix substrate on which a digital driver is mounted.
The digital driver 330 which has a function for placing an output terminal in a high-impedance state and drives data lines and an inspecting circuit 340 which is provided at ends of the data lines on the opposite side from the digital driver 330 are provided. The inspection circuit 340 has two-way switches provided by the data lines and a control means which controls the opening and closure of the switches. The inspection circuit 340 is used to make it possible to decide whether or not there is a spot defect in addition to the inspection of the breaking of a data line and digital driver output. This circuit is dedicated to the inspection and then extremely small-sized, and the circuit can be arranged in a dead space.
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