INSPECTION METHOD OF ALIGNMENT LAYER, METHOD FOR MANUFACTURING LIQUID CRYSTAL DEVICE, LIQUID CRYSTAL DEVICE, AND ELECTRONIC EQUIPMENT

Japanese Patent JP2014222261

A

PROBLEM TO BE SOLVED: To provide an inspection method of an inorganic alignment layer, by which whether or not a pretilt angle of a liquid crystal molecule can be appropriately controlled can be determined prior to filling a space for a liquid crystal layer with a liquid crystal, and to provide a method for manufacturing a liquid crystal device, a liquid crystal device and electronic equipment.SOLUTION: A certain correlation is present between analysis results obtained by carrying out a spatial frequency distribution analysis by two-dimensional Fourier transformation on two-dimensional ruggedness distribution data including surface ruggedness information of an inorganic alignment layer, and pretilt angles of liquid crystal molecules aligned by the inorganic alignment layer. For example, a correlation is present between peak values Pp determined by normalizing a power obtained by the spatial frequency distribution analysis based on a power at a spatial frequency of 0, and pretilt angles θp of liquid crystal molecules. Therefore, by setting a level of the peak value Pp corresponding to an appropriate pretilt angle θp based on the correlation between the peak values Pp and the pretilt angles θp, conditions for forming an inorganic alignment layer 16 can be determined or the inorganic alignment layer 16 can be inspected.

YOSHIDA SHOHEI

JP2013100995A

November 27, 2014

May 13, 2013

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SEIKO EPSON CORP

G02F1/1337; G02F1/13

Masaaki Kamiyanagi
Kazuhiko Miyasaka
Kazuaki Watanabe

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