Title:
INSPECTION METHOD AND INSPECTION APPARATUS
Document Type and Number:
Japanese Patent JP2020160422
Kind Code:
A
Abstract:
To provide: an inspection method capable of easily determining the presence or absence of a defect in a circular polarizing plate; and an inspection apparatus.SOLUTION: In an inspection method, a film-like inspection object 10A comprising a polarizing plate 1A and a release film 16a made of a polyethylene terephthalate-based resin, a phase difference plate 4 including a region with an in-plane phase difference value at a wavelength of 550 nm being larger than the in-plane phase difference value of the release film 16a at a wavelength of 550 nm by 500 to 600 nm, and compensating for the birefringence that the release film 16a has, and a polarizing filter 3A composing a cross Nicol with the polarizing plate 1A are disposed so as to be arranged in this order, light is made incident from one of the inspection object 10A side and the polarizing filter 3A side so that an optical axis 9 passes through the region, and the presence/absence of a defect in the polarizing plate 1A is determined when observing the polarizing filter 3A or the inspection object 10A from the other side.SELECTED DRAWING: Figure 1
Inventors:
KOBAYASHI SHINJI
MIYAJI TAKAAKI
MIYAJI TAKAAKI
Application Number:
JP2019132176A
Publication Date:
October 01, 2020
Filing Date:
July 17, 2019
Export Citation:
Assignee:
SUMITOMO CHEMICAL CO
International Classes:
G02B5/30; G01N21/88; G01N21/892
Domestic Patent References:
| JP2008292201A | 2008-12-04 | |||
| JP2018013438A | 2018-01-25 | |||
| JP2007271349A | 2007-10-18 | |||
| JPH08297883A | 1996-11-12 |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshinori Shimizu
Takashi Mikami
Naoshi Fukuyama
Yoshinori Shimizu
Takashi Mikami
Naoshi Fukuyama