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Patent Searching and Data


Title:
INSPECTION METHOD AND INSPECTION DEVICE OF DISPLAY PANEL
Document Type and Number:
Japanese Patent JP2007047062
Kind Code:
A
Abstract:

To provide an inspection device of a display panel capable of improving detection accuracy of a defect.

This inspection device 1 of the display panel is equipped with: a table 3 capable of adjusting a plane position; an illumination device 4 and a reference panel 5 arranged on the table 3; a CCD camera 6 capable of imaging an inspection panel 2 arranged over the reference panel 5; a table driving control device 9 for moving the table 3; a dimmer 8 for LED illumination for controlling the illumination device 4; a liquid crystal panel driving device 7 capable of controlling the lighting state of each panel 2, 5; and an inspection control device 10. The inspection control device 10 is equipped with a panel alignment means for performing alignment between the inspection panel 2 and the reference panel 5 by moving the table 3, and a defect inspection means for imaging the inspection panel 2 by the CCD camera 6 by lighting the inspection panel 2 and the reference panel 5 and inspecting a displayed defect of the inspection panel 2 based on the imaged image.


Inventors:
FURUYA KAZUHIKO
Application Number:
JP2005233016A
Publication Date:
February 22, 2007
Filing Date:
August 11, 2005
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G01M11/00; G01B11/30; G02F1/13
Attorney, Agent or Firm:
Kinoshita Minoru
Kanji Nakayama
Tsuyoshi Ishizaki