INSPECTION METHOD OF HONEYCOMB STRUCTURE

Japanese Patent JP2015161543

A

PROBLEM TO BE SOLVED: To provide an inspection method of a honeycomb structure capable of simply inspecting a deformed condition of a cell which is opened toward an end surface of a honeycomb structure.SOLUTION: An inspection method of a honeycomb structure includes a step A of measuring the size of an inscribed circle 15 inscribed to a partition wall 1 that defines and forms a cell 2 with respect to at least one cell 2 among a plurality of cells 2 opened toward a first end surface of a honeycomb structure with the honeycomb structure as an inspection object. In the step A, when the cell 2 for measuring the size of the inscribed circle 15 inscribed to the partition wall 1 is taken as a measurement cell 2x and the cell 2 not measuring the size of the inscribed circle 15 inscribed to the partition wall 1 is taken as a non-measurement cell 2y, at least one cell 2 among the cells adjacent to one measurement cell 2 is taken as a non-measurement cell 2y, and at least one cell among the cells 2 adjacent to one non-measurement cell 2y is taken as the measurement cell 2x, and at least one cell among the cells 2 adjacent to one non-measurement cell 2y is taken as the measurement cell 2x.

UESAKA YOSUKE

JP2014035841A

September 07, 2015

February 26, 2014

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NGK INSULATORS LTD

G01B11/16; B01J32/00; B01J35/04; G01N21/88

JP2013024561A	2013-02-04
JP2007237653A	2007-09-20

US20110128370A1

2011-06-02

Ippei Watanabe
Koji Kikawa
Hiroyuki Sato
Shigeru Koike

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