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Title:
INSPECTION METHOD USING GUIDE WAVE
Document Type and Number:
Japanese Patent JP2013088118
Kind Code:
A
Abstract:

To further emphasize a reflection wave of a defective portion by making a noise signal close to zero infinitely and deleting a waveform caused by another mode in an inspection method using a guide wave.

According to an inspection method using a guide wave 1, the guide wave 1 is generated which is propagated in the length direction within a stick-like or pipe-like inspection body 7 to be measured, a reflection wave 2 of the guide wave 1 is detected and on the basis of the reflection wave 2, the inspection body 7 is inspected. The guide wave 1 is generated in the inspection body 7 to be measured by applying an AC voltage to coils 3a, 5a, the reflection wave 2 obtained by reflecting the guide wave 1 in a defective portion 10 is detected and stored in a plurality of detection portions D1, D2, D3 separated by a predetermined distance, the plurality of stored reflection waves 2 are deviated, aligned in the same phase and stored and the reflection waves 2 aligned in the same phase are multiplied by each other.


Inventors:
OGURO KOKI
YOSHIZAKI MASATO
ARAKAWA TAKAHIRO
Application Number:
JP2011225507A
Publication Date:
May 13, 2013
Filing Date:
October 13, 2011
Export Citation:
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Assignee:
IHI INSPECTION & INSTRUMENTATION CO LTD
International Classes:
G01N29/04; G01N29/44
Domestic Patent References:
JPH05346421A1993-12-27
JPH09243608A1997-09-19
JP2007121092A2007-05-17
JP2002236113A2002-08-23
JP2010246692A2010-11-04
JP2012107959A2012-06-07
JPS53180A1978-01-05
Attorney, Agent or Firm:
Minoru Hotta
Toshihiro Nomura