Title:
INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2023110350
Kind Code:
A
Abstract:
To provide an inspection method that is a reflection type inspection method and can easily determine whether there are defects on a circular polarizing plate.SOLUTION: An inspection method determines whether there are defects on a film-shaped inspection target 10 that includes a circular polarizing plate 1 in which a polarizing film 11 and a retardation film 14 are laminated, and a release film 16a which is laminated on the retardation film 14 side of the circular polarizing plate 1 and formed of a polyethylene terephthalate resin. A light source 4, a band-pass filter 2 which allows light having a predetermined wavelength to pass through, a first polarizing section 3A, an inspection target 10, and a second polarizing section 3B are disposed, and an angle θ of incidence of light onto the inspection target 10 is changed so as to minimize effects of the phase difference of the release film 16a. The method determines whether there are defects on the circular polarizing plate 1 by observing light reflected by the inspection target 10 from the second polarizing section 3B side.SELECTED DRAWING: Figure 1
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Inventors:
KOBAYASHI SHINJI
MATSUDA SHUNSUKE
MATSUDA SHUNSUKE
Application Number:
JP2022011738A
Publication Date:
August 09, 2023
Filing Date:
January 28, 2022
Export Citation:
Assignee:
SUMITOMO CHEMICAL CO
International Classes:
G01N21/88; G01M11/00; G02B5/30
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshinori Shimizu
Takashi Mikami
Hisashi Fukuyama
Yoshinori Shimizu
Takashi Mikami
Hisashi Fukuyama