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Title:
INSPECTION SUPPORT DEVICE
Document Type and Number:
Japanese Patent JPH08254418
Kind Code:
A
Abstract:

PURPOSE: To provide an inspection support device which supports the understanding of an inspection target and situations around it and facilitates inspection and monitoring works.

CONSTITUTION: An inspection support device is provided with a signal processing part 3 for generating three-dimensional structure of an inspection target based on measurement data obtained from the inspection target, a measurement result record part 5 for recording the three-dimensional structure data from this signal processing part 3, and a three-dimensional shape storage part 6 for storing the three-dimensional shape model data around the inspection tact as known data beforehand. And it is also provided with an operation part 7 for inputting viewpoint information and display set information of a display image plane for the measurement target, and a presentation part 8 for composing the three- dimensional structure data and the three-dimensional shape model data so as to display graphics.


Inventors:
KATO KATSUMI
DOI MIWAKO
Application Number:
JP5860095A
Publication Date:
October 01, 1996
Filing Date:
March 17, 1995
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01B17/00; G01B17/06; G06T1/00; G06T7/00; G06T17/00; (IPC1-7): G01B17/00; G06T7/00; G06T17/00
Attorney, Agent or Firm:
Takehiko Suzue



 
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