Title:
点検支援装置、方法及びプログラム
Document Type and Number:
Japanese Patent JP7364786
Kind Code:
B2
Abstract:
Provided are an inspection support device, an inspection support method, and an inspection support program capable of satisfactorily outputting, in a case where two or more types of damage are detected from a structure, and particularly, two or more types of damage are detected from the same or adjacent positions of the structure, a damage detection result thereof. A processor of the inspection support device acquires an image obtained by imaging a structure to be inspected and detects damage to the structure on the basis of the acquired image. In a case where two or more types of damage (cracking B and linear free lime C2) to the structure are detected, the processor determines whether or not two or more types of damage are detected from the same or adjacent positions. In a case where determination is made that the cracking B and the linear free lime C2 are detected from the same or adjacent positions when the processor outputs the damage detection result (a damage image, a damage diagram, and the like), the processor preferentially outputs a damage detection result of the linear free lime C2 in accordance with a priority of a damage type ((B) of Fig. 14).
Inventors:
Shuhei Hotta
Application Number:
JP2022511672A
Publication Date:
October 18, 2023
Filing Date:
March 01, 2021
Export Citation:
Assignee:
Fujifilm Corporation
International Classes:
G01N21/88; G06T7/00
Domestic Patent References:
| JP2006112127A | ||||
| JP2006170871A |
Foreign References:
| WO2017130699A1 | ||||
| WO2017056930A1 | ||||
| WO2018165753A1 |
Attorney, Agent or Firm:
Kenzo Matsuura
Kazuki Ohara
Kiyoshi Matsumura
Constitutional Matsuura
Kazuki Ohara
Kiyoshi Matsumura
Constitutional Matsuura
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