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Title:
INSPECTION SUPPORT SYSTEM AND METHOD
Document Type and Number:
Japanese Patent JP2014032039
Kind Code:
A
Abstract:

To provide an inspection support system and method capable of reducing operation load of image recognition processing and accurately acquiring an indicated value even with an analog instrument.

An inspection support system 1 for acquiring an indicated value of an instrument comprises: a storage unit 2 in which a plurality of types and shape patterns of instruments are stored in association with each other; a type identification unit 4 for identifying a type of a target instrument of which indicated value should be acquired; a pattern extraction unit 5 for extracting a shape pattern corresponding to the type identified by the type identification unit 4 from the storage unit; an image acquisition unit 6 for acquiring a photographic image of the target instrument; an image recognition unit 7 for performing image recognition on the indicated value of the photographic image by using the shaped pattern extracted by the pattern extraction unit 5; an image display unit 8 for performing screen display by superimposing the photographic image acquired by the image acquisition unit 6 on the indicated value on which image recognition is performed by the image recognition unit 7; and an indicated value correction unit 9 for correcting the indicated value by using a screen displayed on the image display unit 8.


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Inventors:
NAKAMURA SHIGEAKI
NOMA AKIRA
YAMAMURA KAZUO
Application Number:
JP2012171178A
Publication Date:
February 20, 2014
Filing Date:
August 01, 2012
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G01D9/00; G06K9/03
Domestic Patent References:
JP2000182021A2000-06-30
JPH11175653A1999-07-02
JP2008224376A2008-09-25
JP3035916U1997-04-08
JPH06223165A1994-08-12
JPH0719814A1995-01-20
JP2000182021A2000-06-30
JPH11175653A1999-07-02
JP2008224376A2008-09-25
JP3035916U1997-04-08
JPH06223165A1994-08-12
JPH0719814A1995-01-20
Foreign References:
US20040032504A12004-02-19
US20040032504A12004-02-19
Attorney, Agent or Firm:
Seishin ip patent business corporation



 
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