Title:
検査システム、抽出装置、検査方法及びプログラム
Document Type and Number:
Japanese Patent JP7452682
Kind Code:
B2
Abstract:
An inspection system, an extraction device, an inspection method, an extraction method, and a program that are capable of improving measurement accuracy are provided. An inspection system includes: a measurement device being arranged at a measurement point inside a tunnel, having a reference point, and acquiring a plurality of pieces of data including coordinate values and brightness values of a wall surface of the tunnel as point cloud data by using one or more beams irradiated in irradiation directions at a plurality of different angles to the reference point and receiving reflected light of the beam resulting from scanning the wall surface; a movement means for moving the measurement device to a plurality of measurement points inside the tunnel; and, in the point cloud data acquired by the measurement device for each measurement point, an extraction means for extracting data, based on a distance from the measurement point.
Inventors:
Satoshi Tsuji
Application Number:
JP2022553379A
Publication Date:
March 19, 2024
Filing Date:
October 01, 2020
Export Citation:
Assignee:
NEC
International Classes:
G01B11/30
Domestic Patent References:
| JP2009079953A | ||||
| JP2020037809A |
Foreign References:
| WO2020161852A1 |
Attorney, Agent or Firm:
Ken Ieiri