Title:
INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTION METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2022140081
Kind Code:
A
Abstract:
To provide a technique that, in an inspection system for a component mounting substrate including a plurality of types of inspection devices, can improve inspection efficiency while ensuring the accuracy of inspection.SOLUTION: An inspection system 9 has: first inspection means 91 that executes first inspection based on first image data obtained by picking up an image of an object to be inspected O with first imaging means 911; second inspection means 92 that executes second inspection based on second image data obtained by picking up an image of the object to be inspected with second imaging means 921 different from the first imaging means; first inspection information acquisition means 931 that acquires first inspection information including a result of the first inspection from the first inspection means; effectiveness determination means 932 that determines the effectiveness of the execution of the second inspection by the second inspection means on the object to be inspected based on a predetermined determination condition; and second inspection execution means 933 that determines the necessity of the execution of at least the second inspection based on the details of determination made by the effectiveness determination means.SELECTED DRAWING: Figure 1
Inventors:
ONISHI TAKAKO
Application Number:
JP2021040730A
Publication Date:
September 26, 2022
Filing Date:
March 12, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01B21/20; H05K13/08
Attorney, Agent or Firm:
Hidewa Patent Office