Title:
INSPECTION SYSTEM AND INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2016194434
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection system that can suitably conduct a defect inspection.SOLUTION: An inspection system includes a line camera inspection unit and an area camera inspection unit. The area camera inspection unit includes an area camera photographing unit 5 and an inspection device. The area camera photographing unit 5 radiates inspection light 56 to an inspection object 10 from around the inspection object 10 by a coaxial lighting 52 and a dome lighting 53, and takes a color image by receiving the inspection light 56 reflected in the normal direction of the inspection object 10 with the area camera 51. The inspection device conducts a defect inspection of the inspection object 10 on the basis of the color image and distinguishes a type of default of the inspection object 10 by using color information on the color image at that time.SELECTED DRAWING: Figure 5
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Inventors:
NARITA SHOHEI
MOTOOKA SUMIKAZU
FUJITA YUJI
MOTOOKA SUMIKAZU
FUJITA YUJI
Application Number:
JP2015073821A
Publication Date:
November 17, 2016
Filing Date:
March 31, 2015
Export Citation:
Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G01N21/88; G01B11/00; G01B11/30; G01N21/956
Attorney, Agent or Firm:
Seiichi Inoue
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