To provide an inspection system which inspects efficiently and in detail whether a voltage is normally applied from a plurality of terminals or not.

The inspection system 20 comprises a control part 50 and an inspection jig 52. The control part 50 includes an attachment part 31, a first potential generation circuit 63, a second potential generation circuit 65 and a CPU (an example of detector) 61. The inspection jig 52 includes a input/output part 59, a third potential generation circuit 70 and a fourth potential generation circuit 71. The third potential generation circuit 70 outputs a ground potential to a terminal 58 when an SR terminal 55 and a terminal 57 are connected. The fourth potential generation circuit 71 outputs a bias potential of zener diode D2 to the terminal 58 when the SR terminal 55 and the terminal 57 are not connected. A second potential generation circuit 64 applies a second potential to a DEV terminal 56 when the ground potential and the bias potential are not applied to the DEV terminal 56.