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Title:
INSTRUMENT FOR MEASURING PARTICLE DISTRIBUTION
Document Type and Number:
Japanese Patent JP2008157631
Kind Code:
A
Abstract:

To provide a particle size distribution measuring instrument capable of accurately measuring a sample with high reproducibility, even if the amount of sample is small, and to provide a particle size distribution measuring method.

The particle size distribution measuring instrument is equipped with a sample supply mechanism 2; a sample recovery mechanism 3; a diffracted scattered light intensity distribution data repeated measuring part 41 which measures the space intensity distribution data of diffracted/scattered light, stops measurement if the sample supplied from the sample supply mechanism is exhausted, and which resumes measurement of the space intensity distribution data of the diffracted/scattered light to repeat the measurement of the space intensity distribution data of the diffracted/scattered light and the stoppage the measurement by a plurality number of times; a diffracted/scattered light intensity distribution integrating part 42 for integrating the space intensity distribution data of the diffracted/scattered light repeatedly measured by a plurality number of times; and a particle size distribution calculating part 43 for calculating the particle size distribution, based on the integrated diffracted/scattered light intensity distribution data.


Inventors:
TOTOKI SHINICHIRO
Application Number:
JP2006343182A
Publication Date:
July 10, 2008
Filing Date:
December 20, 2006
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N15/02
Domestic Patent References:
JPH09145590A1997-06-06
JPH09101252A1997-04-15
JPH0894513A1996-04-12
Attorney, Agent or Firm:
Yoshio Kashima