To specify wavelength dependency of a double refraction phase difference caused by double refraction dispersion and a principal axis direction under the double refraction dispersion, in a short time.
A phase shifter 4 has two 1/4-wavelength plates 4a, 4b, and a 1/2-wavelength plate 4c arranged between 1/4-wavelength plates 4a, 4b, and rotated at a prescribed revolution speed, and modulates a phase of light passed through a measuring object 101, and an analyzer 5 is rotated at a revolution speed of two times of that in the 1/2-wavelength plate 4c synchronizedly therewith, and brings the light passed through the phase shifter 4 into a linear polarization. A spectrometer 6 separates light of the linear polarization in response to each wavelength, and a photodetector 7 receives the light after spectrally dispersed to be converted into an electric signal in the every wavelength.
UMEDA TSUNEHIRO
WAKAYAMA TOSHITAKA
KUROKAWA TAKASHI
| JPH05281137A | 1993-10-29 | |||
| JP2000507349A | 2000-06-13 | |||
| JP2001141602A | 2001-05-25 | |||
| JP2000515247A | 2000-11-14 |