Title:
絶縁検査装置および絶縁検査方法
Document Type and Number:
Japanese Patent JP5425709
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To detect a defective part occurring due to application of a high voltage, without the progression of damage.SOLUTION: A processing part 10 executes: high voltage inspection processing of inspecting an insulation state between conductor patterns 3 and 4 as inspection targets on the basis of an insulation resistance R between conductor patterns 3 and 4 at the time when a voltage generation part 7 is controlled to apply a preliminarily determined high voltage between conductor patterns 3 and 4 as an inspection voltage VeH; and low voltage inspection processing of inspecting the insulation state between conductor patterns 3 and 4 on the basis of an insulation resistance R between conductor patterns 3 and 4 at the time when the voltage generation part 7 is controlled to apply an inspection voltage VeL lower than the high voltage between conductor patterns 3 and 4 determined to be in a good insulation state in the high voltage inspection processing.
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Inventors:
Hiroshi Yamazaki
Toshihiko Tsuchiya
Toshihiko Tsuchiya
Application Number:
JP2010122240A
Publication Date:
February 26, 2014
Filing Date:
May 28, 2010
Export Citation:
Assignee:
Hioki Electric Co., Ltd.
International Classes:
G01R31/02; G01R31/12; H05K3/00
Domestic Patent References:
| JP5157798A | ||||
| JP2008122274A | ||||
| JP2010032310A |
Attorney, Agent or Firm:
Shinji Sakai