PURPOSE: To perform the high speed circuit test of an integrated circuit for a timepiece without consuming wasteful power, by allowing a part of FF of a frequency dividing circuit to function in place of a selector and directly inputting a reference frequency signal to the frequency dividing circuit.

CONSTITUTION: A T-terminal 4 is brought to L by external operation and a high speed signal Pf is inputted from a terminal 2. An inverter 11 outputs a reversal signal -Pf and a NOR gate 12 outputs the inverse phase of the signal -Pf, that is, the signal Pf. The output of FF7a is H when the signal Pf is H and comes to L when the signal Pf is L, that is, the signal -Pf is H. Therefore, the output of FF7a comes to the same signal as the signal Pf and the signal Pf is inputted to a frequency dividing circuit 7b. By this method, the high speed circuit test of the integrated circuit for an electronic timepiece can be performed through the circuit 7b.