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Patent Searching and Data


Title:
INTEGRATED CIRCUIT WITH TESTING FUNCTION
Document Type and Number:
Japanese Patent JPS62285090
Kind Code:
A
Abstract:

PURPOSE: To achieve a reduction in the cost, by supplying a clock pulse to a functioning circuit from a test terminal once prohibiting an input thereto from a preceding frequency dividing stage.

CONSTITUTION: A frequency dividing stage 3 and a driving circuit 4 composes a functioning circuit to be tested. Normally, with a test terminal 6 held at '0', a frequency dividing stage 2 starts, an output thereof is inverted in the level through a gate circuit 5 and supplied to a frequency dividing stage 3 to generate a pulse for driving a motor from a circuit 4 receiving the output from the frequency dividing stage 3. When carrying out a test, a testing clock pulse is supplied to the terminal 6 with the pulse width at the '0' level being smaller than a half that of the output from the preceding frequency dividing stage 2. The frequency dividing stage 2 is reset by '1' level of the clock pulse. On the other hand, the clock pulse is inverted in the level with the circuit 5 and fed to the frequency dividing stage 3 to perform a frequency dividing operation and an output pulse is generated from the circuit 4 according to the output pulse thereof. Thus, the frequency dividing stage 3 and the circuit 4 are tested.


Inventors:
AOKI HIROSHI
Application Number:
JP12896686A
Publication Date:
December 10, 1987
Filing Date:
June 03, 1986
Export Citation:
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Assignee:
SEIKOSHA KK
International Classes:
G04D7/00; G04G3/00; G04G99/00; (IPC1-7): G04G1/00; G04G3/00
Domestic Patent References:
JPS57201885A1982-12-10
Attorney, Agent or Firm:
Kazuko Matsuda