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Title:
干渉計装置及び光干渉法
Document Type and Number:
Japanese Patent JP4376103
Kind Code:
B2
Abstract:

To measure a shape of a surface to be inspected with high precision by obtaining quantitative errors of fringe scanning and feeding back the errors to the fringe scanning mechanism.

A plurality of sets of interference fringe intensity data obtained before and after step change of fringe scanning are obtained (S2). Based on the data, a linear error is calculated when the linear error is assumed to be included in variation of phase difference between an object light of the interference light and a reference light (S3), and the amount of the step change of the phase difference of the fringe scanning is corrected corresponding to the linear error (S4). When the linear error exceeds the tolerance, the fringe scanning is executed again based on the amount of the step change after the correction (S5→S2), and the initial phase distribution is calculated based on the interference fringe intensity data obtained by the re-execution (S6).

COPYRIGHT: (C)2006,JPO&NCIPI


Inventors:
Tsutomu Morimoto
Hiroyuki Takamatsu
Application Number:
JP2004087152A
Publication Date:
December 02, 2009
Filing Date:
March 24, 2004
Export Citation:
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Assignee:
KABUSHIKI KAISHA KOBE SEIKO SHO
International Classes:
G01B9/02
Domestic Patent References:
JP4026682B2
JP2000275007A
JP9250907A
Attorney, Agent or Firm:
Takeo Honjo