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Patent Searching and Data


Title:
INTERFEROMETER HAVING ADJUSTABLE DIFFERENCE OF OPTICAL PATH LENGTH
Document Type and Number:
Japanese Patent JPH08320260
Kind Code:
A
Abstract:

To obtain a pure measuring signal at low cost by a constitution wherein an increment generator coupled with means for varying the difference of optical path length generates a reference signal for varying the frequencies of reference signal and interference signal independently from the variation rate of the difference of optical path length.

Light from a laser diode 22 is enlarged through a collimator 23 and arrives, as a parallel luminous flux, at a lattice generator comprising movable and fixed reference lattices 24a, 24b through a displacement unit. A produced bright/dark signal arrives at an amplifier reading photoelectric light receiving element 25. A reference signal generated in the amplifier of element 25 has same frequency as a measuring signal generated at the output of light receiving prestage amplifier in an avalanche photodiode 17 and superposed with noise. Both signals arrive at a demodulation and subsequent conversion unit 26 for two paths having phase shift of 90°. Output signal from the unit 26 is converted through an A/D converter 27 and stored in a control evaluation unit 19. Signal from a displacement unit 18 is fed to the unit 19 and can be represented as a function of displaced place.


Inventors:
ANDOREAZU DORUSERU
KAARU HAINTSUDO DONNAAHATSUKE
BIITE MERAA
GIYUNTAA MASHIYUKE
Application Number:
JP4567496A
Publication Date:
December 03, 1996
Filing Date:
February 08, 1996
Export Citation:
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Assignee:
ZEISS CARL JENA GMBH
International Classes:
A61B3/10; G01B9/02; G01J9/02; (IPC1-7): G01J9/02; G01B9/02
Attorney, Agent or Firm:
Matsuda