Title:
INTERNAL DEFECT DETECTOR FOR ELECTRIC DEVICE
Document Type and Number:
Japanese Patent JPS58152324
Kind Code:
A
More Like This:
JPS58145578 | 【考案の名称】不良碍子検出装置の接触電極 |
JP2001013197 | ELECTRICAL APPARATUS TESTING DEVICE |
Inventors:
MORIOKA SHIYOUJI
Application Number:
JP3540482A
Publication Date:
September 09, 1983
Filing Date:
March 05, 1982
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R31/12; G01M99/00; G01R31/00; G01R31/08; H01H35/26; (IPC1-7): G01M19/00; G01R31/00; H01H35/26
Domestic Patent References:
JPS5417870U | 1979-02-05 |
Attorney, Agent or Firm:
Masuo Oiwa
Previous Patent: BREAKER WITH RESISTANCE CONTACT
Next Patent: INTERNAL DEFECT DETECTOR FOR ELECTRIC DEVICE
Next Patent: INTERNAL DEFECT DETECTOR FOR ELECTRIC DEVICE