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Title:
INTERNAL RESIDUAL STRESS MEASURING INSTRUMENT, AND MEASURING METHOD THEREFOR
Document Type and Number:
Japanese Patent JP2005227138
Kind Code:
A
Abstract:

To provide an internal residual stress measuring instrument and a method therefor capable of evaluating easily and nondestructively an internal residual stress of a large dimension of actual structure not allowing destructive measurement to grasp a residual service life of equipment, the structure or the like to be operated efficiently.

This internal residual stress measuring instrument and this method is provided with a surface residual stress measuring part 1 for measuring nondestructively a surface residual stress of the measured object, an internal residual stress evaluating part 2 for finding the residual stress in an optional position inside the object, based on a distribution of the surface residual stress of the measured object measured by the surface residual stress measuring part, and a residual stress distribution displaying part 3 for displaying visually the residual stress distribution found by the internal residual stress evaluating part.


Inventors:
Takasu, Norinao
Asano, Masayuki
Itaya, Masao
Sumiya, Rie
Saito, Toshiyuki
Application Number:
JP2004000036385
Publication Date:
August 25, 2005
Filing Date:
February 13, 2004
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01L1/00; G01L1/00; (IPC1-7): G01L1/00