Title:
Internal temperature measuring device
Document Type and Number:
Japanese Patent JP6350212
Kind Code:
B2
Abstract:
Provided is an internal temperature measurement device capable of measuring an internal temperature of a measuring object for which the thermal resistance value of a non-heating body present on the surface side of the object is unknown, more accurately with better responsiveness than hitherto. The internal temperature measurement device 10 includes a MEMS chip 12 including: two cells 20a, 20b for measuring two heat fluxes for calculating an internal temperature of a measuring object for which the thermal resistance value of a non-heating body is unknown; and a cell 20c for increasing a difference between the heat fluxes.
Inventors:
Shinya Nakagawa
Masao Shimizu
Hama Tsuyoshi Kuchiguchi
Masao Shimizu
Hama Tsuyoshi Kuchiguchi
Application Number:
JP2014218441A
Publication Date:
July 04, 2018
Filing Date:
October 27, 2014
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G01K7/00
Domestic Patent References:
| JP2007212407A | ||||
| JP2002372464A | ||||
| JP61239127A |
Foreign References:
| US20090187115 | ||||
| US20080300819 |
Attorney, Agent or Firm:
Kazunobu Sera
Yoshiyuki Kawaguchi
Hiroyasu Kanai
Takehiko Sekine
Takeshi Nakamura
Katsuhiko Imahori
Hironobu Yazawa
Yoshiyuki Kawaguchi
Hiroyasu Kanai
Takehiko Sekine
Takeshi Nakamura
Katsuhiko Imahori
Hironobu Yazawa
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