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Title:
高スループット電荷検出質量分光分析のためのイオン・トラップ・アレイ
Document Type and Number:
Japanese Patent JP7398811
Kind Code:
B2
Abstract:
An electrostatic linear ion trap (ELIT) array includes a plurality of ion mirrors and a plurality of elongated charge detection cylinders each defining an axial passageway centrally therethrough, the ion mirrors and the charge detection cylinders arranged relative to one another such that each charge detection cylinder is positioned between a different respective pair of the ion mirrors with the respective axial passageways of each coaxial with one another, wherein the axial passageways of the ELITs are not coaxial with one another, means for selectively directing at least one ion into each of the plurality of ELITs, and means for controlling each of the ion mirrors in a manner which causes the at least one ion in at least two of the ELITs to become trapped therein and to simultaneously oscillate back and forth between the respective ion mirrors each time passing through the respective charge detection cylinder.

Inventors:
Jarold, Martin F
Botamanenko, Daniel
Application Number:
JP2020568469A
Publication Date:
December 15, 2023
Filing Date:
January 11, 2019
Export Citation:
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Assignee:
The Trustees of Indiana University
International Classes:
H01J49/42; G01N27/62; G01N27/622; H01J49/00; H01J49/02; H01J49/06; H01J49/40
Domestic Patent References:
JP11144675A
JP2010515210A
JP2011523172A
Foreign References:
US20160336165
US6888130
US5880466
Other References:
Tristan Doussineau et al.,Infrared multiphoton dissociation tandem charge detection-mass spectrometry of single megadalton electrosprayed ions,Review of Scientific Instruments,2011年,Vol.82,pp.084104-1 - 084104-8
Attorney, Agent or Firm:
Osamu Yamamoto
Toru Miyamae
Junichi Matsuo
Ryota Suematsu