Title:
ION TRAP MASS SPECTROGRAPH
Document Type and Number:
Japanese Patent JP3653504
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an ion trap spectrometry and an apparatus for the same which is capable of stable and very sensitive and accurate mass spectrometry independently of the stability of the structure of ions to be analyzed.
SOLUTION: In an ion trap, a means is provided to generate an ion trapping electric field asymmetrical about a reference face and to pass the central point of an annular electrode. It is perpendicular to the central axis of the annular electrode, and rapidly resonates and amplifies ions and then emits the ions from the ion trap in a short time. By making the ion trapping electric field generated in a space between ion trapping electrodes asymmetrical about the reference face which passes the central point of the annular electrode and is perpendicular to the central axis of the annular electrode by the means, the ions can be resonated and emitted rapidly, resulting in preventing a shift in mass due to the stability of the structure of the ions and obtaining very precise and sensitive mass spectrographic results.
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Inventors:
Kichi Nari Kiyomi
Yoshiaki Kato
Tadao Mimura
Masaru Tomioka
Yoshiaki Kato
Tadao Mimura
Masaru Tomioka
Application Number:
JP2002033307A
Publication Date:
May 25, 2005
Filing Date:
February 12, 2002
Export Citation:
Assignee:
Hitachi High-Technologies Corporation
International Classes:
G01N27/62; H01J49/40; H01J49/42; (IPC1-7): H01J49/42; G01N27/62; H01J49/40
Domestic Patent References:
| JP10069881A | ||||
| JP6318448A | ||||
| JP2000268772A | ||||
| JP2001297730A |
Foreign References:
| US5693941 |
Attorney, Agent or Firm:
Yasuo Sakuta