Title:
イオントラップ質量分析器
Document Type and Number:
Japanese Patent JP5706548
Kind Code:
B2
Abstract:
An ion trap mass analyzer includes an elongated tunnel that has a wall, a longitudinal axis and an inner space. The wall includes a substrate and conductor trace patterns. There is also a variable electric potential means for providing electric potentials which is connected to the conductor trace patterns. The conductor trace patterns and the variable electric potential means provide a variable electric field within the inner space of the tunnel for transferring, storing, and analyzing ions.
Inventors:
Ding, Chuan-Fan
Application Number:
JP2014003318A
Publication Date:
April 22, 2015
Filing Date:
January 10, 2014
Export Citation:
Assignee:
Fudan University
International Classes:
H01J49/42; G01N30/72; H01J49/06; H01J49/26
Domestic Patent References:
| JP2002015699A |
Foreign References:
| US4985626 |
Attorney, Agent or Firm:
Hiroe Associates Patent Office