Title:
イオントラップ飛行時間型質量分析装置
Document Type and Number:
Japanese Patent JP5164478
Kind Code:
B2
Abstract:
To provide an ion trap time-of-flight mass spectroscope of high sensitivity.
Ions fly in a time-of-flight mass spectrometry section 9 (time-of-flight mass spectrometry means) and are transported to an MCP (detector) 8 efficiently by varying the period of high-voltage pulses applied to a PUSH electrode 6 according to the distribution of the number of ions at a multi-pole section 5. Ions are transported to the MCP (detector) 8 efficiently, thus achieving the ion trap time-of-flight mass spectroscope for obtaining high-sensitivity mass spectra.
COPYRIGHT: (C)2008,JPO&INPIT
Inventors:
Kan Nakamura
Master Fawn Tsukasa
Terui Yasushi
Takuya Saeki
Master Fawn Tsukasa
Terui Yasushi
Takuya Saeki
Application Number:
JP2007221374A
Publication Date:
March 21, 2013
Filing Date:
August 28, 2007
Export Citation:
Assignee:
Hitachi High-Technologies Corporation
International Classes:
H01J49/40; G01N27/62; H01J49/42
Domestic Patent References:
| JP2005183022A | ||||
| JP2006126217A | ||||
| JP2009514179A | ||||
| JP2005327579A | ||||
| JP2006093160A | ||||
| JP2004303719A |
Foreign References:
| WO2006061625A1 |
Attorney, Agent or Firm:
Polaire Patent Business Corporation
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