Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
JIG FOR ALIGNMENT BETWEEN SEMICONDUCTOR WAFER AND EXTERNAL CIRCUMFERENTIAL RING, AND PLASMA ETCHING METEHOD OF SEMICONDUCTOR WAFER
Document Type and Number:
Japanese Patent JP2007200965
Kind Code:
A
Abstract:

To provide a jig for aligning a semiconductor wafer with an external circumferential ring in order to prevent excessive etching on the external circumference of the wafer and carry out uniform etching, and to provide a method of plasma etching using it.

The plasma etching method of semiconductor wafer comprises a step C for center alignment between a base plate and an external circumferential ring by inserting a guide pin for base plate into a center hole of the base plate, a step D for center alignment between the base plate and an aligning plate by inserting the guide pin for aligning plate into the center hole of the alignment plate through the center hole of the base plate, a step E for measuring deviation of the alignment plate in the X and Y directions, and a step G for transferring the wafer to an X-Y stage with a robot hand by compensating for a location of the X-Y stage or an arrangement location of the wafer W with the robot hand on the basis of the measured deviation.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
ONISHI KUNIAKI
TERASAKI NORIYUKI
ICHIKAWA HIROYUKI
Application Number:
JP2006014781A
Publication Date:
August 09, 2007
Filing Date:
January 24, 2006
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SHINETSU HANDOTAI KK
SPEEDFAM CO LTD
International Classes:
H01L21/68; H01L21/3065
Domestic Patent References:
JP2003297894A2003-10-17
JP2004349587A2004-12-09
JP2001358097A2001-12-26
Attorney, Agent or Firm:
Mikio Yoshimiya