Title:
高速データ出力素子のジッタ測定装置及びトータルジッタ測定方法
Document Type and Number:
Japanese Patent JP4382362
Kind Code:
B2
Abstract:
In a system and method for measuring total litter in a high speed data processing device, a high-speed data processing device, as an object under test, receives test data and generates differential output data at a high rate. A test device provides the test data to the high speed data processing device and provides a comparison operation reference clock. A high-speed differential comparator is coupled between the high speed data processing device and the test device for comparing the differential output data of the high speed data processing device in response to the comparison operation reference clock. In this manner, measurement of total jitter in a high speed data processing device can be achieved rapidly and without the need for employing a high-cost measuring instrument.
Inventors:
Zhang Tatsumi
Application Number:
JP2003002570A
Publication Date:
December 09, 2009
Filing Date:
January 08, 2003
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO.,LTD.
International Classes:
G01R29/02; G01R31/28; G01R31/319; G01R31/317; G06F11/24; G06F11/30; G06F15/00; H04L25/02
Domestic Patent References:
| JP2002502041A | ||||
| JP2000188617A | ||||
| JP2000035463A | ||||
| JP2002107392A |
Foreign References:
| WO2002012909A1 |
Attorney, Agent or Firm:
Masatake Shiga
Takashi Watanabe
Takashi Watanabe