Title:
判定システム、判定方法、プログラム
Document Type and Number:
Japanese Patent JP7424386
Kind Code:
B2
Abstract:
In a determination system according to the present invention, an acquisition unit acquires waveform data indicating waveforms pertaining to a current supplied to a drive device that generates a load for testing the durability of a test object. A determination unit determines predictors of damage to the test object on the basis of a change obtained from the waveform data and caused by a prescribed directional component of power applied to the drive device. This determination system is capable of improving precision in determining predictors of damage to a test object.
Inventors:
Kazutaka Ikeda
Hiroto Nakano
Hiroto Nakano
Application Number:
JP2021546505A
Publication Date:
January 30, 2024
Filing Date:
June 03, 2020
Export Citation:
Assignee:
Panasonic IP Management Co., Ltd.
International Classes:
G01M17/02; B60C19/00; G01M99/00
Domestic Patent References:
JP2004132847A | ||||
JP50062088A | ||||
JP10142128A | ||||
JP4315940A |
Foreign References:
CN110186957A |
Attorney, Agent or Firm:
Kenji Kamada
Kenji Maeda
Kenji Maeda
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