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Patent Searching and Data


Title:
LARGE MICROBLOCK DEVICE WITH BUILT-IN TEST CIRCUIT
Document Type and Number:
Japanese Patent JPH04215081
Kind Code:
A
Abstract:

PURPOSE: To facilitate verification of connection of a wire between a plurality of large microblock devices.

CONSTITUTION: During of large microblock devices 2 and 5 test for respective functions, a test terminal 25 is set to a '1' level. Thereby, a terminal B of a normal mode selecting test circuit 7 is connected to a terminal Y, the large microblock devices 2 and 5 are electrically disconnected from each other and individually tested. During varification of connection of a wiring 3 between the large microblock devices 2 and 5, a test terminal 24 is set to a '1' level. Thereby, a terminal B of each of interblock wiring varifying test circuits 3 and 6 is connected to a terminal Y, a signal from an input terminal 21 is outputted to an output terminal 28 and an output terminal 26. Thus, through confirmation of a signal from the output terminal 28 = a signal from the output terminal 26, connection of the wiring 3 can be varified.


Inventors:
UENO YUKO
Application Number:
JP40183490A
Publication Date:
August 05, 1992
Filing Date:
December 13, 1990
Export Citation:
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Assignee:
MATSUSHITA ELECTRONICS CORP
International Classes:
G06F11/22; G01R31/28; (IPC1-7): G01R31/28; G06F11/22
Attorney, Agent or Firm:
Hiroshi Maeda