Title:
LARGE SCALE INTEGRATED CIRCUIT AND ITS ABNORMALITY DETECTION
Document Type and Number:
Japanese Patent JPH04232481
Kind Code:
A
Abstract:
PURPOSE: To improve abnormality detection precision of large scale integrated circuits.
CONSTITUTION: A signal of a specific level generated in an abnormality detection part 6 is given to a CPU part 1a and an input and output control 1b through an output instruction bus 6b. Next, the signal is returned to the abnormality detection part 6 through a reading-return bus 6a and the presence of abnormality and the system of a signal wire in which the abnormality occurs are detected by performing the discrimination of the signal level.
Inventors:
KOIZUMI KOJI
Application Number:
JP40932990A
Publication Date:
August 20, 1992
Filing Date:
December 28, 1990
Export Citation:
Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G06F3/00; G06F11/22; G06F13/00; H01L21/66; G01R31/28; (IPC1-7): G01R31/28; G06F3/00; G06F11/22; G06F13/00; H01L21/66
Attorney, Agent or Firm:
Yoshikazu Tani (1 person outside)