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Patent Searching and Data


Title:
LASER DIFFRACTION-TYPE MEASURING APPARATUS FOR PARTICLE SIZE DISTRIBUTION
Document Type and Number:
Japanese Patent JPH09281026
Kind Code:
A
Abstract:

To obtain a laser diffraction-type measuring apparatus by which a uniform and thin sample layer can be formed irrespective of whether the kind of a sample to be measured is dry or liquid and by which the generation of a multiple scattering can be made extremely small even when the concentration of the sample is high.

A circular hollow (a recessed part) 2 is formed on a cell 1 which is constituted of a plane glass or the like. Regarding the depth of the hollow 2, cells whose hollow has various depths are prepared when a sample is a suspension. According to the kind of the sample, one cell is selected out of the cells in such a way that a laser beam can be transmitted. When a dry powder is used as the sample, the size of particles is estimated in advance, and the cell in which the depth of the hollow 2 is a little deeper than the diameter of a largest particle in the sample is used. When the cell 1 is constituted in this manner so as to put the sample to be measured into the hollow, a thin sample layer can be formed, and the generation of a multiple scattering operation can be made extremely small even when the concentration of the sample is high.


Inventors:
TAKEUCHI KAZU
Application Number:
JP8673896A
Publication Date:
October 31, 1997
Filing Date:
April 09, 1996
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N15/02; (IPC1-7): G01N15/02
Attorney, Agent or Firm:
西岡 義明