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Title:
LASER GENERATED PLASMA METHOD EXTREME ULTRAVIOLET LIGHT SOURCE
Document Type and Number:
Japanese Patent JP2006210157
Kind Code:
A
Abstract:

To provide an LPP type extreme ultraviolet light source in which an Sn target can be supplied to a plasma forming part in a high speed and generation of debris can be suppressed and light emission spectrum in the vicinity of 13.5 nm can be made sharp.

A liquid SnH4 supply part 2 has a compression/cooling room 2a to compress the liquid SnH4 and a nozzle part 2b in order to supply the liquid SnH4 into a chamber 1 as liquid droplet or liquid jet. The liquid SnH4 is pressurized in the compression/cooling room 2a and ejected into the chamber 1 as the liquid jet or the liquid droplet from the nozzle part 2b. The ejected liquid jet or the liquid droplet of SnH4 advances in the vacuum, and reach a laser beam irradiation part B. Here, emitted from the laser device 5 and condensed laser beam for plasma generation is irradiated, and the plasma is formed. By this, EUV light of 13.5 nm is obtained.


Inventors:
HOTTA KAZUAKI
TAKABAYASHI YUICHI
ABE TAMOTSU
HIRAMOTO TATSUMI
Application Number:
JP2005020857A
Publication Date:
August 10, 2006
Filing Date:
January 28, 2005
Export Citation:
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Assignee:
USHIO ELECTRIC INC
GIGAPHOTON INC
KOMATSU MFG CO LTD
International Classes:
H05G2/00; G03F7/20; G21K5/02; G21K5/08; H01L21/027
Attorney, Agent or Firm:
Shunichiro Nagasawa