Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
LASER SAMPLING ANALYZER
Document Type and Number:
Japanese Patent JPH0634604
Kind Code:
A
Abstract:

PURPOSE: To constantly control the irradiation intensity of pulse laser so as to improve the controlling stability in a laser sampling analyzer where a fixed specimen is gasified by applying pulse laser light.

CONSTITUTION: After an He-Ne laser beam (reference light) 3 is amplitude- modulated by a modulator 31, it is applied onto a fixed specimen 12 through a lens 8 in such a manner that its light axis may be aligned with that a YAG laser beam (pulse laser light), and the position of the lens 8 is regulated by comparing the phases of the reflected light and the amplitude-modulated signal by a phase detector 33, so that the distance between the lens 8 and the specimen 12 may be kept constant. On the other hand, the output light intensity of the YAG laser beam 1 is controlled according to the phase comparison result, thereby stabilizing the intensity of the beam applied to the specimen 12.


Inventors:
NISHITARUMI TAKESHI
KOGA TADATAKA
Application Number:
JP19174992A
Publication Date:
February 10, 1994
Filing Date:
July 20, 1992
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
G01N27/62; (IPC1-7): G01N27/62
Attorney, Agent or Firm:
Akio Takahashi (1 person outside)