Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
LIGHT CONDUCTION DETECTOR
Document Type and Number:
Japanese Patent JPS62278432
Kind Code:
A
Abstract:

PURPOSE: To obtain a correct measured value with a higher S/N, by arranging optical filters placed within a light incidence section, one for cutting off short wavelength range and the other for cutting off light transmitting radio waves.

CONSTITUTION: Light to be measured of a plasma entering at an incidence window 1 which serves as filter for cut off short wavelength range while vacuum sealing up the inside of a detector section is transmitted through filters 2 and 3 arranged sequentially separated from the incidence window 1 and detected with a light receiving element 4 placed behind the filter 3. The filter 2 is made up of a copper mesh deposited on a sapphire plate for cutting off short wavelength range and shall have a sufficient transmission factor for the light being measured in the measurement of plasma and a reflectance enough to cut off noise signals with the wavelength larger than the light being measured. The incidence window 1 and the filter 3 have a sufficient transmission factor for the light being measured in the measurement of plasma and a reflectance enough to cut off noise signals with the wavelength less than the light being measured. This can interrupt the incidence of light with the wavelength less than about 50μ into the light receiving element 4 and the mixing of radio waves when the light receiving element 4 is used as an antenna.


Inventors:
HOSHI KOICHI
Application Number:
JP12290386A
Publication Date:
December 03, 1987
Filing Date:
May 28, 1986
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NEC CORP
International Classes:
G01N21/35; G01N21/3581; H05H1/00; (IPC1-7): G01N21/35; H05H1/00
Attorney, Agent or Firm:
Takashi Koshiba