Title:
LIGHT EMITTING SPECTROCHEMICAL ANALYSIS APPARATUS
Document Type and Number:
Japanese Patent JPS5311083
Kind Code:
A
Abstract:
PURPOSE: To make possible selective measurement of full-wavelength region or an arbitrary wavelength region at high accuracy by arbitrarily setting the sweep voltage of a power supply part for scanning.
Inventors:
NAKAMURA NOBUO
KONISHI BUNYA
KONISHI BUNYA
Application Number:
JP8529676A
Publication Date:
February 01, 1978
Filing Date:
July 16, 1976
Export Citation:
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01N21/67; G01J3/28; (IPC1-7): G01N21/00
Previous Patent: METHOD OF INSPECTING UNIFORMITY OF GLASS STRUCTURE
Next Patent: LIGHT EMITTING SPECTROCHEMICAL ANALYSIS APPARATUS
Next Patent: LIGHT EMITTING SPECTROCHEMICAL ANALYSIS APPARATUS