LIGHT INTENSITY MEASURING DEVICE AND METHOD

Title:

LIGHT INTENSITY MEASURING DEVICE AND METHOD

Document Type and Number:

Japanese Patent JP2003294529

Kind Code:

A

Abstract:

To measure light intensity highly accurately by a light intensity measuring device.

This light intensity measuring device includes an array waveguide lattice 302 for separating input light into one or more light signals and outputting output light of the separated light signals, and photodetectors 304-1 to 304-n for measuring the intensity of the output light. In the device, a waveguide transmission property which is a relation between the wavelength of the separated light signal and the transmission intensity of the output light is changed by a temperature control device 306 in the array waveguide lattice 302, and a data processing device 307 accumulates measurement data measured by the photodetectors 304-1 to 304-n and determines the intensity of the separated light signals based on the maximum value of the measurement data.

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Inventors:

KATO KAZUTOSHI
YAMABAYASHI YOSHIAKI
ONO SHIGERU

Application Number:

JP2002096761A

Publication Date:

October 15, 2003

Filing Date:

March 29, 2002

Export Citation:

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Assignee:

NTT ELECTRONICS CORP

International Classes:

G01J3/36; G01J1/02; G01J1/42; H04B10/079; H04B10/29; H04B10/293; H04B10/294; H04B10/564; H04B10/572; H04J14/00; H04J14/02; (IPC1-7): G01J3/36; G01J1/02; G01J1/42; H04B10/04; H04B10/06; H04B10/14; H04B10/16; H04B10/17; H04J14/00; H04J14/02

Attorney, Agent or Firm:

Yoshikazu Tani (2 outside)

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