Title:
光学顕微鏡および顕微鏡法
Document Type and Number:
Japanese Patent JP7449629
Kind Code:
B2
Abstract:
A light microscope having a scanner for scanning a sample with illuminating light and a light detector for measuring sample light. A microlens array having a plurality of microlenses is arranged in front of the light detector in the region of a pupil plane. The light detector respectively has a plurality of detector elements behind each microlens and has a complete readout frequency of at least 100 kHz. By means of the detector elements arranged behind the respective microlens, a wavefront datum regarding the sample light is determined. Moreover, a sample point signal is computed from signals of the detector elements. Illuminating light is successively deflected onto different sample points with the scanner and corresponding sample point signals are captured, wherein, for at least some of the different sample points, a corresponding wavefront datum is also determined. The determined wavefront data can be taken into account in a calculation of a sample image from the plurality of sample point signals.
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Inventors:
Unhat, Thiemo
Schwett, Daniel
Schwett, Daniel
Application Number:
JP2021528348A
Publication Date:
March 14, 2024
Filing Date:
November 07, 2019
Export Citation:
Assignee:
CARL ZEISS MICROSCOPY GMBH
International Classes:
G02B21/00; G01N21/64; G02B21/06; G02B21/36
Domestic Patent References:
| JP2009178502A | ||||
| JP2012010790A | ||||
| JP10311950A |
Foreign References:
| US20150362713 |
Attorney, Agent or Firm:
Tomokazu Adachi