Title:
LIGHT SOURCE DEVICE AND INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2022070056
Kind Code:
A
Abstract:
To provide a light source device, etc. that can restrain a deterioration in quality of an object to be inspected, and have high versatility.SOLUTION: A light source device 1 is used for inspection. The light source device 1 comprises a light source 20 for emitting first light L1, and an optical member 30 including a plurality of wavelength conversion bodies for absorbing a portion of the first light L1, and emitting second light L2 having a wavelength different from that of the first light L1. The optical member 30 comprises an incidence surface 30a on which the first light L1 is incident, and an emission surface 30b for emitting emission light L including another portion of the first light L1 incident from the incidence surface 30a and the second light L2. The emission light L has intensity equal to or higher than 5% of peak intensity over a wavelength band of 450 nm or more and 800 nm or less. The emission surface 30b is a light emission surface for the second light L2.SELECTED DRAWING: Figure 1
Inventors:
ABE TAKASHI
HAYASHI SHINTARO
MOTEGI SHOGO
HAYASHI SHINTARO
MOTEGI SHOGO
Application Number:
JP2020179072A
Publication Date:
May 12, 2022
Filing Date:
October 26, 2020
Export Citation:
Assignee:
PANASONIC IP MAN CORP
International Classes:
F21S2/00; F21V9/32; F21V9/38; G01N21/84; G01N21/892
Attorney, Agent or Firm:
Hiroi Arai
Teraya Eisaku
Shinichi Michizaka
Teraya Eisaku
Shinichi Michizaka