Title:
LIGHT WAVEFORM OBSERVING INSTRUMENT
Document Type and Number:
Japanese Patent JPS649323
Kind Code:
A
Abstract:
PURPOSE:To prevent a sampled waveform from being affected by a background noise and improve a deflection sensitivity by forming the accelerating electrode of a sampling streak tube to a plate-like configuration provided with an opening. CONSTITUTION:Light is made incident upon the photoelectric surface 131 of a sampling streak tube 1. An electron beam emitted from the photoelectric surface 131 is accelerated by a plate-like accelerating electrode 2 provided with an opening 3 in an approximate center. The electron beam that has passed the electrode 2 is swept by a deflection electrode 133 in a given direction. The deflected electron beam is sampled by a sampling electrode 4. Thus, a temporal change in the sampled electron beam is converted to a spatial luminance distribution on a fluorescent screen 134 and observed as a streak image. Since the electrode 2 has a plate-like configuration provided with the opening 3, a photoelectron due to scattered light is shielded by a non-opening area. It reduces a probability wherein the photoelectron becomes a background noise to be mixed in signal electrons.
Inventors:
KOISHI YU
TSUCHIYA YUTAKA
KINOSHITA KATSUYUKI
INAGAKI YOSHINORI
TSUCHIYA YUTAKA
KINOSHITA KATSUYUKI
INAGAKI YOSHINORI
Application Number:
JP16353587A
Publication Date:
January 12, 1989
Filing Date:
June 30, 1987
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK
International Classes:
G01J1/02; G01J11/00; H01J31/50; (IPC1-7): G01J1/02; H01J31/50
Attorney, Agent or Firm:
Uemoto Masaharu
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