To obtain high wavelength resolution over a wide wavelength range.
A first polarization conversion element 23 formed so that intensity ratio obtained from emission light to the monotonous change of a wavelength in a specified range changes monotonously, and a second polarization conversion element 24 formed so that the intensity ratio obtained from emission light to the monotonous change of a wavelength in a specified range changes periodically are used. A wavelength closest to the wavelength obtained from the emission light of the first polarization conversion element 24 is selected as the wavelength of light to be measured from a plurality of candidate wavelengths obtained with high wavelength resolution from the emission light of the second polarization conversion element 24 when the light to be measured enters.
Otani, Akihito
Tanimoto, Takao
Next Patent: ADHESIVE STRENGTH MEASURING DEVICE AND MEASURING METHOD OF TONER
