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Patent Searching and Data


Title:
LIGHT WAVELENGTH MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2005003495
Kind Code:
A
Abstract:

To obtain high wavelength resolution over a wide wavelength range.

A first polarization conversion element 23 formed so that intensity ratio obtained from emission light to the monotonous change of a wavelength in a specified range changes monotonously, and a second polarization conversion element 24 formed so that the intensity ratio obtained from emission light to the monotonous change of a wavelength in a specified range changes periodically are used. A wavelength closest to the wavelength obtained from the emission light of the first polarization conversion element 24 is selected as the wavelength of light to be measured from a plurality of candidate wavelengths obtained with high wavelength resolution from the emission light of the second polarization conversion element 24 when the light to be measured enters.


Inventors:
Furukawa, Hiroshi
Otani, Akihito
Tanimoto, Takao
Application Number:
JP2003000166807
Publication Date:
January 06, 2005
Filing Date:
June 11, 2003
Export Citation:
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Assignee:
ANRITSU CORP
International Classes:
G01J3/447; (IPC1-7): G01J3/447