Title:
LINEARLY DRIVEN TYPE SAMPLE CUT-FACE MEASURING METHOD AND INSTRUMENT
Document Type and Number:
Japanese Patent JP3845732
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a simple linearly driven type sample cut-face measuring method and instrument of a small size capable of obtaining satisfactory sample face information.
SOLUTION: This method/instrument is provided with a sample fixing part 2 for fixing a sample 1, a sample feeding mechanism 9 for feeding the sample 1, slide rails 3 arranged in both sides of the sample fixing part 2, a cutting blade 4, an image scanner 6, and a linearly driven type moving body 7 for integrating the cutting blade 4 and the image scanner 6, and reciprocated along the slide rails 3, and a cut face of the sample 1 cut by the cutting blade 4 is read by the image scanner 6.
Inventors:
Toshiro Higuchi
Kenichi Kudo
Shigeya Tada
Kenichi Kudo
Shigeya Tada
Application Number:
JP2004035857A
Publication Date:
November 15, 2006
Filing Date:
February 13, 2004
Export Citation:
Assignee:
National University Corporation Tokyo University
International Classes:
G01N1/06; G01N1/28; (IPC1-7): G01N1/06; G01N1/28
Domestic Patent References:
| JP7280531A | ||||
| JP2003048193A |
Attorney, Agent or Firm:
Mamoru Shimizu