Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
LITHOGRAPHY EQUIPMENT AND METHOD FOR MANUFACTURING DEVICE
Document Type and Number:
Japanese Patent JP2005294838
Kind Code:
A
Abstract:

To provide lithography equipment capable of supplying a liquid having a high index of refraction to a space between a final lens element and a substrate and reducing distortion of the substrate.

The lithography equipment comprises a lighting system for providing a projection beam of radiation; a support structure for supporting a pattern forming device that gives a pattern to the cross-section of the projection beams; a substrate table for supporting the substrate, having a bur plate and a vacuum system for establishing a pressure difference across the entire substrate held by the bur plate, in which the pressure difference is larger at the circumferential part of the substrate than the central part; a projection system for projecting the pattern-formed beam onto the target part of the substrate; and a liquid supply system for supplying a liquid having a high index of refraction to a space between the final element of the projection system and the substrate held by the substrate table, wherein the density of the bur on the bur plate is higher at the circumferential part than the central part.


Inventors:
ZAAL KOEN JACOBUS JOHANNES MAR
JEROEN JOHANNES SOPHIA MARIA M
OTTENS JOOST JEROEN
Application Number:
JP2005100825A
Publication Date:
October 20, 2005
Filing Date:
March 31, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ASML NETHERLANDS BV
International Classes:
G03F7/20; H01L21/027; (IPC1-7): H01L21/027; G03F7/20
Domestic Patent References:
JPH1050810A1998-02-20
JP2001060617A2001-03-06
JP2003249542A2003-09-05
JP2001127145A2001-05-11
JPH10303114A1998-11-13
JPH10233433A1998-09-02
JPH06168866A1994-06-14
JPH06124873A1994-05-06
JPH10340846A1998-12-22
Attorney, Agent or Firm:
Hideto Asamura
Hajime Asamura
Yutaka Yoshida
Yukio Iwamoto