Title:
LOOP TESTER FOR DATA TRANSMISSION ZONE
Document Type and Number:
Japanese Patent JPS5510296
Kind Code:
A
Abstract:
A loopback testing system for an asynchronously operating fully duplex data transmission path comprising proximate and remote stations, a proximate-to-remote data transmission channel for transmitting data to the remote station at a relatively high maximum data transmission rate, and a remote-to-proximate data transmission channel for transmitting data to the proximate station at a relatively low maximum data transmission rate. A test-waveform generator applies to the proximate station, for transmission along the proximate-to-remote channel, a test waveform presenting a data transmission rate at least approximately equal to the aforementioned higher maximum data transmission rate. A loopback circuit at the remote station receives the thusly transmitted test waveform and reapplies it at the remote station for transmission back to the proximate station along the remote-to-proximate channel. However, the loopback circuit includes a digital frequency divider which reduces the waveform-element transmission rate presented by the test waveform to such a level that the waveform-element duration of the test waveform, as transmitted back to the proximate station, at least approximately corresponds to the aforementioned lower maximum data transmission rate.
Inventors:
KAARU HAINTSU PARASU
Application Number:
JP8084479A
Publication Date:
January 24, 1980
Filing Date:
June 28, 1979
Export Citation:
Assignee:
TEKADE FELTEN & GUILLEAUME
International Classes:
H04L1/24; H04L25/02; H04L69/40; (IPC1-7): H04L25/02