Title:
LSI TEST DEVICE
Document Type and Number:
Japanese Patent JP3134972
Kind Code:
B2
Abstract:
PURPOSE: To automatically carry out cut-off motion without a cut-off motion instruction which a program preparer prepares for every test item.
CONSTITUTION: A LSI test device is provided with a cut-off forming section 8 which takes out the number of tested objects and the description information of a measuring section 43 connected to the tested object to form the instruction program for cut-off motion, the fourth memory section 31 to store an instruction code on which a conversion section 2 converts the program of a cut-off instruction, and the fifth memory section 44 to store parameters through which the conversion section 2 converts the program of the cut-off instruction. In addition, the test device is provided with a control monitoring means which controls the motions of the cut-off forming section 8 and of an execution section 6 and moreover monitors a driving section 40, and in the case where the tested object fails when one item of tests on the tested object ends, gives the instruction for the cut-off motion, and a cut-off motion means which receives the motion instruction from the control monitoring means and takes out the instruction code from the fourth memory section 31 to make the driving section carry out the cut-off motion.
Inventors:
Mahiro Ozaki
Application Number:
JP3182393A
Publication Date:
February 13, 2001
Filing Date:
February 22, 1993
Export Citation:
Assignee:
Yokogawa Electric Corporation
International Classes:
G01R31/28; (IPC1-7): G01R31/28
Domestic Patent References:
| JP5126910A | ||||
| JP58135972A |