Title:
LSI TESTING DEVICE
Document Type and Number:
Japanese Patent JP3696507
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an LSI testing device which can easily test an electronic device.
SOLUTION: This LSI testing device is equipped with a power source which supplies a DC source voltage to the electronic device, a detection part which detects the source current supplied from the power source to the electronic device, and a decision part which decides whether the electronic device is normal; and the power source has a means for superposing a superposed signal having specific cycles on the source voltage, and the decision part decides whether the electronic device is normal according to the source current that the detection part detects when the source voltage having the superposed signal is supplied to the electronic device.
Inventors:
Yasuo Furukawa
Masahiro Ichinomiya
Masaki Hashizume
Tadamasa Takeomi
Masahiro Ichinomiya
Masaki Hashizume
Tadamasa Takeomi
Application Number:
JP2000401987A
Publication Date:
September 21, 2005
Filing Date:
December 28, 2000
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/00; G01R31/02; G01R31/28; G01R31/3183; G01R31/319; G06F11/22; G01R31/26; (IPC1-7): G01R31/26; G01R31/02; G01R31/28; G01R31/3183; G06F11/22
Domestic Patent References:
| JP9015294A | ||||
| JP54102978A |
Attorney, Agent or Firm:
Akihiro Ryuka
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