Title:
LSI WITH TESTING CIRCUIT
Document Type and Number:
Japanese Patent JPH05251641
Kind Code:
A
Abstract:
PURPOSE: To provide an LSI with a testing circuit for easily observing a condition of an LSI internal circuit from an LSI external output pin.
CONSTITUTION: An LSI with a test, circuit comprises a signal group lead-out, line for leading out, a signal group 101 from a predetermined place of internal circuits 31 and 32, and a comparator 8 in which data written in a RAM 4 with data expected as the signal group 101 is read out of the RAM 4 and the data is compared with the signal group 101 led out through the signal group lead-out line whether they are the same or not.
Inventors:
NASU YASUYUKI
Application Number:
JP4884292A
Publication Date:
September 28, 1993
Filing Date:
March 05, 1992
Export Citation:
Assignee:
NEC CORP
International Classes:
G11C29/00; G11C29/02; G11C29/56; H01L21/66; G01R31/28; H01L21/822; H01L27/04; (IPC1-7): H01L27/04; G01R31/28; H01L21/66
Attorney, Agent or Firm:
Wakabayashi Tadashi